Beilstein J. Nanotechnol.2012,3, 747–758, doi:10.3762/bjnano.3.84
obtain a true representation of the sample and its changes over time. This paper presents an automated, adaptivealgorithm for the required processing of AFM images. The algorithm adaptively corrects for both common one-dimensional distortions as well as the most common two-dimensional distortions. This
applicable to all channels of AFM data, and can process images in seconds.
Keywords: adaptivealgorithm; artifact correction; atomic force microscopy; high-speed atomic force microscope; image processing; Introduction
Atomic force microscopes (AFMs) are a useful tool for investigating nanoscale surfaces
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Figure 1:
This figure shows the cumulative effects of typical distortions on model AFM data. Panels A though ...